IEEE - Institute of Electrical and Electronics Engineers, Inc. - On the corrupting influence of variability in semiconductor manufacturing

Proceedings of 1999 Winter Conference on Simulation

Author(s): Schoemig, A.K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Phoenix, AZ, USA
Conference Date: 5 December 1999
Volume: 1
ISBN (Paper): 0-7803-5780-9
DOI: 10.1109/WSC.1999.823295
Regular:

This paper describes two simulation experiments using a model of a real medium sized multi-product semiconductor chip fabrication facility. The results presented clearly show the corrupting... View More

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