IEEE - Institute of Electrical and Electronics Engineers, Inc. - A software-based CM and DM measurement system for the conducted EMI

IECON'99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society

Author(s): Yu-Kang Lo ; Huang-Jen Chiu ; Tzu-Herng Song ; Mu-Ping Chen ; Tain-Shy Luor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: San Jose, CA, USA, USA
Conference Date: 29 November 1999
Volume: 1
ISBN (Paper): 0-7803-5735-3
DOI: 10.1109/IECON.1999.822205
Regular:

In this paper, a software-based common mode (CM) and differential mode (DM) measurement system for the conducted EMI is presented. A user friendly interface is developed to provide an effective... View More

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