IEEE - Institute of Electrical and Electronics Engineers, Inc. - A fault-detection and diagnosis scheme by dynamic computation of finite-state automaton tables

IECON'99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society

Author(s): Ramkumar, K.B. ; Druckenmuller, M. ; Xi, Y.X. ; Philips, P. ; Presig, H.A. ; Ho, W.K. ; Lim, K.W.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: San Jose, CA, USA, USA
Conference Date: 29 November 1999
Volume: 2
ISBN (Paper): 0-7803-5735-3
DOI: 10.1109/IECON.1999.816486
Regular:

This paper addresses the problem of fault-detection and diagnosis using finite-state automaton (FSA) models. These models partition the state-space into finite regions and contain information on... View More

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