IEEE - Institute of Electrical and Electronics Engineers, Inc. - An approach to detect defective CCD in digital cameras

IECON'99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society

Author(s): Xiaomang Zhang ; Kubo, N. ; Obuchi, Y. ; Kanbe, T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: San Jose, CA, USA, USA
Conference Date: 29 November 1999
Volume: 2
ISBN (Paper): 0-7803-5735-3
DOI: 10.1109/IECON.1999.816438
Regular:

A CCD sensor array in a digital camera can receive damage from alpha particles, protons and X-rays etc. At present, the damaged sensors can be treated only at the manufacturer's service station... View More

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