IEEE - Institute of Electrical and Electronics Engineers, Inc. - An automatic testing and diagnosis for FPGAs

Proceedings 1999 Pacific Rim International Symposium on Dependable Computing

Author(s): Doumar, A. ; Ito, H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Hong Kong, Hong Kong
Conference Date: 16 December 1999
Page(s): 45 - 52
ISBN (Paper): 0-7695-0371-3
DOI: 10.1109/PRDC.1999.816211
Regular:

This paper presents a new design for testing and diagnosing the SRAM-based field programmable gate arrays (FPGA). By slightly modifying the original FPGA's SRAM memory, the new architecture... View More

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