IEEE - Institute of Electrical and Electronics Engineers, Inc. - Machine grading and blemish detection in apples

Proceedings of Fifth International Symposium on Signal Processing and its Applications

Author(s): Rennick, G. ; Attikiouzel, Y. ; Zaknich, A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Brisbane, Queensland, Australia, Australia
Conference Date: 22 August 1999
Volume: 2
ISBN (Paper): 1-86435-451-8
DOI: 10.1109/ISSPA.1999.815736
Regular:

Five classifiers including the K-means, fuzzy c-means, K-nearest neighbour, multi-layer perceptron neural network and probabilistic neural network classifiers are compared for application to... View More

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