IEEE - Institute of Electrical and Electronics Engineers, Inc. - Primality and identity testing via Chinese remaindering

40th Annual Symposium on Foundations of Computer Science

Author(s): Agrawal, M. ; Biswas, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: New York City, NY, USA, USA
Conference Date: 17 October 1999
Page(s): 202 - 208
ISBN (Paper): 0-7695-0409-4
ISSN (Paper): 0272-5428
DOI: 10.1109/SFFCS.1999.814592
Regular:

Gives a simple and new primality testing algorithm by reducing primality testing for a number n to testing if a specific univariate identity over Z/sub n/ holds. We also give new randomized... View More

Advertisement