IEEE - Institute of Electrical and Electronics Engineers, Inc. - Model driven automatic unit testing technology tool architecture

Gateway to the New Millennium. 18th Digital Avionics Systems Conference. Proceedings

Author(s): Toeppe, S. ; Ranville, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: St Louis, MO, USA, USA
Conference Date: 24 October 1999
Volume: 2
ISBN (Paper): 0-7803-5749-3
DOI: 10.1109/DASC.1999.822084
Regular:

Traditional approaches to unit testing involve establishing test vectors from the source code and establishing expected results that can be used to determine if a particular case has been... View More

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