IEEE - Institute of Electrical and Electronics Engineers, Inc. - Parallel DSP based implementation of an automated visual quality inspection system

1999 7th IEEE Conference on Emerging Technologies and Factory Automation. Proceedings ETFA'99

Author(s): Vivas, C. ; Ortega, J.G. ; Vargas, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Barcelona, Spain, Spain
Conference Date: 18 October 1999
Volume: 1
ISBN (Paper): 0-7803-5670-5
DOI: 10.1109/ETFA.1999.815429
Regular:

A first approach to the parallel implementation of an automated visual quality inspection (VQI) system for printed ceramic dishes is described. The VQI system is designed to detect defects on the... View More

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