IEEE - Institute of Electrical and Electronics Engineers, Inc. - A fault monitoring architecture for the diagnosis of hardware and software faults in manufacturing systems

1999 7th IEEE Conference on Emerging Technologies and Factory Automation. Proceedings ETFA'99

Author(s): Stanton, M.J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Barcelona, Spain, Spain
Conference Date: 18 October 1999
Volume: 1
ISBN (Paper): 0-7803-5670-5
DOI: 10.1109/ETFA.1999.815421
Regular:

A classification is presented for faults and failures in manufacturing systems. The basis for classification is the apparent source of the fault or failure. This leads to the conclusion that a... View More

Advertisement