IEEE - Institute of Electrical and Electronics Engineers, Inc. - A fuzzy logic application in SPC evaluation and control

1999 7th IEEE Conference on Emerging Technologies and Factory Automation. Proceedings ETFA'99

Author(s): Wang, L.R. ; Rowlands, H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Barcelona, Spain, Spain
Conference Date: 18 October 1999
Volume: 1
ISBN (Paper): 0-7803-5670-5
DOI: 10.1109/ETFA.1999.815419
Regular:

Control chart pattern identification is an important aspect of statistical process control (SPC). In the conventional use of SPC, the user may just need to know whether or not the process is out... View More

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