IEEE - Institute of Electrical and Electronics Engineers, Inc. - Rigidity analysis from range image data for automatic inspection of filter components

1999 7th IEEE Conference on Emerging Technologies and Factory Automation. Proceedings ETFA'99

Author(s): Rodrigues, M.A. ; Liu, Y.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Barcelona, Spain, Spain
Conference Date: 18 October 1999
Volume: 1
ISBN (Paper): 0-7803-5670-5
DOI: 10.1109/ETFA.1999.815408
Regular:

Recent developments in computer vision and pattern recognition have enabled the development of sophisticated vision-based quality control systems for automatic inspection. We present a new... View More

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