IEEE - Institute of Electrical and Electronics Engineers, Inc. - Artificial neural networks approach to tool condition monitoring in a metal turning operation

1999 7th IEEE Conference on Emerging Technologies and Factory Automation. Proceedings ETFA'99

Author(s): D.E. Dimla, Snr.
Sponsor(s): IEEE Ind. Electron. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Barcelona, Spain, Spain
Conference Date: 18 October 1999
Volume: 1
ISBN (Paper): 0-7803-5670-5
DOI: 10.1109/ETFA.1999.815371
Regular:

Presents a neural networks based cutting tool wear monitoring system for metal turning operations. Multilayer perceptron neural networks were used to distinguish and classify worn/sharp... View More

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