IEEE - Institute of Electrical and Electronics Engineers, Inc. - Modular fault diagnosis based on discrete event systems for a mixer chemical process

1999 7th IEEE Conference on Emerging Technologies and Factory Automation. Proceedings ETFA'99

Author(s): Garcia, E. ; Morant, F.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Barcelona, Spain, Spain
Conference Date: 18 October 1999
Volume: 2
ISBN (Paper): 0-7803-5670-5
DOI: 10.1109/ETFA.1999.813115
Regular:

The knowledge of failure type and their location is an indispensable requirement for the establishment of tasks of adequate recovery strategies and maintenance of both factory automation and... View More

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