IEEE - Institute of Electrical and Electronics Engineers, Inc. - The mean temperature of semiconductor bodies measurement using radiometric method

1999 9th International Crimean Microwave Conference 'Microwave and Telecommunication Technology'. Conference Proceedings

Author(s): Galiullin, T.A. ; Grigoriev, A.V. ; Zastela, M.Yu. ; Sedelnikov, Yu.E.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Sevastopol, Crimea, Ukraine, Ukraine
Conference Date: 13 September 1999
Page(s): 399 - 400
ISBN (Paper): 966-572-003-1
DOI: 10.1109/CRMICO.1999.815285
Regular:

The basic problems of the mean temperature values of semiconductor bodies measurement by radiometric methods are studied. The objectives are to minimize the deviation of determined data from the... View More

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