IEEE - Institute of Electrical and Electronics Engineers, Inc. - A knowledge-based inspection workstation

Proceedings 1999 International Conference on Information Intelligence and Systems

Author(s): Messina, E. ; Horst, J. ; Kramer, T. ; Huang, H. ; Tsai, T. ; Amatucci, E.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Bethesda, MD, USA, USA
Conference Date: 31 October 1999
Page(s): 216 - 222
ISBN (Paper): 0-7695-0446-9
DOI: 10.1109/ICIIS.1999.810264
Regular:

We are building an inspection workstation development environment to use as a testbed for understanding what types of knowledge, e.g. data, algorithms and processes, can increase the productivity... View More

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