IEEE - Institute of Electrical and Electronics Engineers, Inc. - Path delay fault testing of Benes multistage interconnection networks

ICECS'99. Proceedings of ICECS'99. 6th IEEE International Conference on Electronics, Circuits and Systems

Author(s): Vergos, H.T. ; Bellos, M. ; Nikolos, D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Pafos, Cyprus, Cyprus
Conference Date: 5 September 1999
Volume: 2
ISBN (Paper): 0-7803-5682-9
DOI: 10.1109/ICECS.1999.813425
Regular:

In this paper we present two methods for path delay fault testing of circuit-switched Benes Multistage Interconnection Networks (MINs) with centralized control. Although the number of paths is... View More

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