IEEE - Institute of Electrical and Electronics Engineers, Inc. - Property-based testability analysis for hierarchical RTL designs

ICECS'99. Proceedings of ICECS'99. 6th IEEE International Conference on Electronics, Circuits and Systems

Author(s): Makris, Y. ; Orailoglu, A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Pafos, Cyprus, Cyprus
Conference Date: 5 September 1999
Volume: 2
ISBN (Paper): 0-7803-5682-9
DOI: 10.1109/ICECS.1999.813423
Regular:

We present an analysis methodology that identifies testability bottlenecks in RTL designs, based on the concept of transparency properties. We discuss a hierarchical test generation methodology,... View More

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