IEEE - Institute of Electrical and Electronics Engineers, Inc. - Scan-path based testing of systems on a chip

ICECS'99. Proceedings of ICECS'99. 6th IEEE International Conference on Electronics, Circuits and Systems

Author(s): Mourad, S. ; Greene, B.S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Pafos, Cyprus, Cyprus
Conference Date: 5 September 1999
Volume: 2
ISBN (Paper): 0-7803-5682-9
DOI: 10.1109/ICECS.1999.813421
Regular:

An effective, low overhead cost method for isolating and testing cores and UDLs on a SOC. The added hardware for test application and compaction as part of the CUT when generating test patterns.... View More

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