IEEE - Institute of Electrical and Electronics Engineers, Inc. - Peak power constrained test sets: generation heuristics and experiments

ICECS'99. Proceedings of ICECS'99. 6th IEEE International Conference on Electronics, Circuits and Systems

Author(s): Macii, A. ; Macii, E.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Pafos, Cyprus, Cyprus
Conference Date: 5 September 1999
Volume: 2
ISBN (Paper): 0-7803-5682-9
DOI: 10.1109/ICECS.1999.813383
Regular:

Life-cycle and reliability of an electronic device are strictly related to the maximum (or peak) power the device dissipates in a single clock cycle. Particular care in situations of peak power... View More

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