IEEE - Institute of Electrical and Electronics Engineers, Inc. - Deriving a fault architecture from defect history

Proceedings 10th International Symposium on Software Reliability Engineering

Author(s): von Mayrhauser, A. ; Wang, J. ; Ohlsson, M.C. ; Wohlin, C.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Boca Raton, FL, USA, USA
Conference Date: 1 November 1999
Page(s): 295 - 303
ISBN (Paper): 0-7695-0443-4
ISSN (Paper): 1071-9458
DOI: 10.1109/ISSRE.1999.809335
Regular:

As software systems mature, there is the danger that not only code decays, but software architectures as well. We adapt a reverse architecting technique to defect reports of a series of releases.... View More

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