IEEE - Institute of Electrical and Electronics Engineers, Inc. - Failure correlation in software reliability models

Proceedings 10th International Symposium on Software Reliability Engineering

Author(s): Goseva-Popstojanova, K. ; Trivedi, K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Boca Raton, FL, USA, USA
Conference Date: 1 November 1999
Page(s): 232 - 241
ISBN (Paper): 0-7695-0443-4
ISSN (Paper): 1071-9458
DOI: 10.1109/ISSRE.1999.809328
Regular:

Perhaps the most stringent restriction that is present in most software reliability models is the assumption of independence among successive software failures. Our research was motivated by the... View More

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