IEEE - Institute of Electrical and Electronics Engineers, Inc. - Developing a high-quality software tool for fault tree analysis

Proceedings 10th International Symposium on Software Reliability Engineering

Author(s): Dugan, J.B. ; Sullivan, K.J. ; Coppit, D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Boca Raton, FL, USA, USA
Conference Date: 1 November 1999
Page(s): 222 - 231
ISBN (Paper): 0-7695-0443-4
ISSN (Paper): 1071-9458
DOI: 10.1109/ISSRE.1999.809327
Regular:

Sophisticated dependability analysis techniques are being developed in academia and research labs, but few have gained wide acceptance in industry. To be valuable, such techniques must be... View More

Advertisement