IEEE - Institute of Electrical and Electronics Engineers, Inc. - Using simulation for assessing the real impact of test coverage on defect coverage

Proceedings 10th International Symposium on Software Reliability Engineering

Author(s): Briand, L. ; Pfahl, D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Boca Raton, FL, USA, USA
Conference Date: 1 November 1999
Page(s): 148 - 157
ISBN (Paper): 0-7695-0443-4
ISSN (Paper): 1071-9458
DOI: 10.1109/ISSRE.1999.809319
Regular:

The use of test coverage measures (e.g. block coverage) to control the software test process has become an increasingly common practice. This is justified by the assumption that higher test... View More

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