IEEE - Institute of Electrical and Electronics Engineers, Inc. - Predicting deviations in software quality by using relative critical value deviation metrics

Proceedings 10th International Symposium on Software Reliability Engineering

Author(s): Schneidewind, N.F. ; Nikora, A.P.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Boca Raton, FL, USA, USA
Conference Date: 1 November 1999
Page(s): 136 - 146
ISBN (Paper): 0-7695-0443-4
ISSN (Paper): 1071-9458
DOI: 10.1109/ISSRE.1999.809318
Regular:

We develop a new metric, relative critical value deviation (RCVD), for classifying and predicting software quality. The RCVD is based on the concept that the extent to which a metric's value... View More

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