IEEE - Institute of Electrical and Electronics Engineers, Inc. - Testing object-oriented programs - an integrated approach

Proceedings 10th International Symposium on Software Reliability Engineering

Author(s): Mei-Hwa Chen ; Kao, H.M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Boca Raton, FL, USA, USA
Conference Date: 1 November 1999
Page(s): 73 - 82
ISBN (Paper): 0-7695-0443-4
ISSN (Paper): 1071-9458
DOI: 10.1109/ISSRE.1999.809312
Regular:

Traditional testing techniques often overlook object-oriented faults that are either caused by inheritance and/or polymorphism features or are introduced in object management. We present an... View More

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