IEEE - Institute of Electrical and Electronics Engineers, Inc. - Characterisation and performance of high power packaged devices

MTT/ED/AP/LEO Societies Joint Chapter United Kingdom and Republic of Ireland Section. 1999 High Frequency Postgraduate Student Colloquium

Author(s): Pattison, L. ; Linton, D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Leeds, UK, UK
Conference Date: 17 September 1999
Page(s): 133 - 138
ISBN (Paper): 0-7803-5577-6
DOI: 10.1109/HFPSC.1999.809293
Regular:

This paper presents a measurement system that combines the capabilities of a vector network analyser, load and source pull and time domain measurement in a single test-bench. The system is based... View More

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