IEEE - Institute of Electrical and Electronics Engineers, Inc. - Material issues in reliability of optical fiber communication lasers

1999 IEEE LEOS Annual Meeting Conference Proceedings. LEOS'99. 12th Annual Meeting

Author(s): Chu, S.N.G.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: San Francisco, CA, USA, USA
Conference Date: 8 November 1999
Volume: 1
ISBN (Paper): 0-7803-5634-9
ISSN (Paper): 1092-8081
DOI: 10.1109/LEOS.1999.813546
Regular:

Reliability of telecommunication laser diodes at their normal operation conditions is usually estimated by extrapolation of degradation rates obtained at accelerated aging conditions. The... View More

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