IEEE - Institute of Electrical and Electronics Engineers, Inc. - Spatial coherence characterization of EUV undulator radiation

1999 IEEE LEOS Annual Meeting Conference Proceedings. LEOS'99. 12th Annual Meeting

Author(s): Chang, C. ; Naulleau, P. ; Anderson, E.H. ; Attwood, D.T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: San Francisco, CA, USA, USA
Conference Date: 8 November 1999
Volume: 1
ISBN (Paper): 0-7803-5634-9
ISSN (Paper): 1092-8081
DOI: 10.1109/LEOS.1999.813471
Regular:

Summary form only given. Coherent radiation is readily available at EUV wavelengths due to the advent of undulator beamlines at synchrotron radiation facilities such as the advanced light source... View More

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