IEEE - Institute of Electrical and Electronics Engineers, Inc. - Internal resistance and carrier transit time in PIN photodetectors

1999 IEEE LEOS Annual Meeting Conference Proceedings. LEOS'99. 12th Annual Meeting

Author(s): Flynn, E.J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: San Francisco, CA, USA, USA
Conference Date: 8 November 1999
Volume: 2
ISBN (Paper): 0-7803-5634-9
ISSN (Paper): 1092-8081
DOI: 10.1109/LEOS.1999.812012
Regular:

The frequency response of PIN diodes was analyzed by Read (1958). Starting with one of Maxwell's equations it was shown that the small-signal frequency response of the diode should exhibit a phase... View More

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