IEEE - Institute of Electrical and Electronics Engineers, Inc. - Optical characterization of thin dielectric waveguides

1999 IEEE LEOS Annual Meeting Conference Proceedings. LEOS'99. 12th Annual Meeting

Author(s): Xu Guang Huang ; Carosi, G. ; Persans, P. ; Xi-Cheng Zhang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: San Francisco, CA, USA, USA
Conference Date: 8 November 1999
Volume: 2
ISBN (Paper): 0-7803-5634-9
ISSN (Paper): 1092-8081
DOI: 10.1109/LEOS.1999.811954
Regular:

We propose a modified prism-coupling method to measure the refractive index and thickness of single-mode thin waveguides. It is based on the effective index measurement in two orthogonal... View More

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