IEEE - Institute of Electrical and Electronics Engineers, Inc. - Dead-space effect on noise in Si UV-selective avalanche photodiode

1999 IEEE LEOS Annual Meeting Conference Proceedings. LEOS'99. 12th Annual Meeting

Author(s): Pauchard, A. ; Besse, P.A. ; Popovic, R.S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: San Francisco, CA, USA, USA
Conference Date: 8 November 1999
Volume: 2
ISBN (Paper): 0-7803-5634-9
ISSN (Paper): 1092-8081
DOI: 10.1109/LEOS.1999.811949
Regular:

In the recent years, a great deal of research has been devoted to dead-space effects in avalanche photodiodes (APD) with submicron multiplication regions. Measurements and theoretical models have... View More

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