IEEE - Institute of Electrical and Electronics Engineers, Inc. - Laser diode linewidth measurement by means of self-mixing interferometry

1999 IEEE LEOS Annual Meeting Conference Proceedings. LEOS'99. 12th Annual Meeting

Author(s): Giuliani, G. ; Norgia, M. ; Donati, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: San Francisco, CA, USA, USA
Conference Date: 8 November 1999
Volume: 2
ISBN (Paper): 0-7803-5634-9
ISSN (Paper): 1092-8081
DOI: 10.1109/LEOS.1999.811939
Regular:

We have demonstrated a new technique for the measure of the linewidth of laser diodes (LD), based on the self-mixing effect. The linewidth is obtained from a measurement of the interferometric... View More

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