IEEE - Institute of Electrical and Electronics Engineers, Inc. - Auger suppression in type-II mid-IR laser diodes

1999 IEEE LEOS Annual Meeting Conference Proceedings. LEOS'99. 12th Annual Meeting

Author(s): Flatte, M.E. ; Olesberg, J.T. ; Boggess, T.F. ; Hasenberg, T.C. ; Grein, C.H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: San Francisco, CA, USA, USA
Conference Date: 8 November 1999
Volume: 2
ISBN (Paper): 0-7803-5634-9
ISSN (Paper): 1092-8081
DOI: 10.1109/LEOS.1999.811873
Regular:

Auger recombination is the limiting process for carrier lifetimes at 300 K lasing densities in interband mid-infrared (mid-IR) active regions. The dominant Auger process is intrinsic, and thus is... View More

Advertisement