IEEE - Institute of Electrical and Electronics Engineers, Inc. - Near-field scanning optical microscopic studies of micro-ring resonators

1999 IEEE LEOS Annual Meeting Conference Proceedings. LEOS'99. 12th Annual Meeting

Author(s): Vander Rhodes, G.H. ; Goldberg, B.B. ; Unlu, M.S. ; Sai-Tak Chu ; Little, B.E.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: San Francisco, CA, USA, USA
Conference Date: 8 November 1999
Volume: 2
ISBN (Paper): 0-7803-5634-9
ISSN (Paper): 1092-8081
DOI: 10.1109/LEOS.1999.811846
Regular:

Near-field Scanning Optical Microscopy has been used to measure internal optical modes in channel waveguides and ring resonators. The period of the observed standing modes is a direct measure of... View More

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