IEEE - Institute of Electrical and Electronics Engineers, Inc. - Mechanical processing error measurement by holographic interferometry using a photorefractive crystal

1999 IEEE LEOS Annual Meeting Conference Proceedings. LEOS'99. 12th Annual Meeting

Author(s): Urushibata, G. ; Shiratori, A. ; Obara, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: San Francisco, CA, USA, USA
Conference Date: 8 November 1999
Volume: 2
ISBN (Paper): 0-7803-5634-9
ISSN (Paper): 1092-8081
DOI: 10.1109/LEOS.1999.811824
Regular:

Holographic interferometry is a useful technique for non-destructive inspection of deformation, displacement, and vibration for intelligent manufacturing systems. Especially, by using a... View More

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