IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis of near-field effects in artificial dielectric structures using rigorous coupled-wave analysis

1999 IEEE LEOS Annual Meeting Conference Proceedings. LEOS'99. 12th Annual Meeting

Author(s): Nakagawa, W. ; Tyan, R.-C. ; Sun, P.-C. ; Fainman, Y.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: San Francisco, CA, USA, USA
Conference Date: 8 November 1999
Volume: 2
ISBN (Paper): 0-7803-5634-9
ISSN (Paper): 1092-8081
DOI: 10.1109/LEOS.1999.811815
Regular:

Artificial dielectric (AD) materials, where the optical properties of a material are altered through the introduction of subwavelength periodic structuring, have extensive applications in... View More

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