IEEE - Institute of Electrical and Electronics Engineers, Inc. - Spectral mode-beat phenomena in a cylindrical microcavity

1999 IEEE LEOS Annual Meeting Conference Proceedings. LEOS'99. 12th Annual Meeting

Author(s): Klunder, D.J.W. ; Balistreri, M.L.M. ; Blom, F.C. ; Driessen, A. ; Hoekstra, H.J.W.M. ; Kuipers, L. ; van Hulst, N.F.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: San Francisco, CA, USA, USA
Conference Date: 8 November 1999
Volume: 2
ISBN (Paper): 0-7803-5634-9
ISSN (Paper): 1092-8081
DOI: 10.1109/LEOS.1999.811812
Regular:

Detailed spectral analysis of photon scanning tunneling microscope images has been carried out. The analysis of spectral mode-beat phenomena leads to an accurate determination of mode profiles and... View More

Advertisement