IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reduced cavity loss for ultra-low threshold vertical cavity surface emitting lasers

1999 IEEE LEOS Annual Meeting Conference Proceedings. LEOS'99. 12th Annual Meeting

Author(s): Huffaker, D.L. ; Zou, Z. ; Deppe, D.G.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: San Francisco, CA, USA, USA
Conference Date: 8 November 1999
Volume: 2
ISBN (Paper): 0-7803-5634-9
ISSN (Paper): 1092-8081
DOI: 10.1109/LEOS.1999.811763
Regular:

We demonstrate the importance of identifying and reducing cavity losses in high Q cavities in order to obtain very low threshold currents with high slope efficiency in vertical cavity surface... View More

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