IEEE - Institute of Electrical and Electronics Engineers, Inc. - Contribution to electrical fast transient/burst modelling

Proceedings of 1999 International Symposium on Electromagnetic Compatibility (EMC'99)

Author(s): Stephane, L. ; Jean-Louis, B.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Seattle, WA, USA, USA
Conference Date: 2 August 1999
Volume: 1
ISBN (Paper): 0-7803-5057-X
DOI: 10.1109/ISEMC.1999.812966
Regular:

In order to determine the instability of any electronic device during the design process, electrical fast transients/burst (EFT/B) may be applied successively on the main power and input/output... View More

Advertisement