IEEE - Institute of Electrical and Electronics Engineers, Inc. - Estimating EMC measurement uncertainty using logarithmic terms (dB)

Proceedings of 1999 International Symposium on Electromagnetic Compatibility (EMC'99)

Author(s): Bronaugh, E.L. ; Osburn, J.D.M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Seattle, WA, USA, USA
Conference Date: 2 August 1999
Volume: 1
ISBN (Paper): 0-7803-5057-X
DOI: 10.1109/ISEMC.1999.812931
Regular:

This paper gives background for understanding the use of logarithmic data for making statistical calculations to estimate measurement uncertainties in EMC measurements. When multiplicative data... View More

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