IEEE - Institute of Electrical and Electronics Engineers, Inc. - Measurement of conducted emissions. Possible sources for measurement uncertainties

Proceedings of 1999 International Symposium on Electromagnetic Compatibility (EMC'99)

Author(s): Krattenmacher, H. ; Schwab, A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Seattle, WA, USA, USA
Conference Date: 2 August 1999
Volume: 1
ISBN (Paper): 0-7803-5057-X
DOI: 10.1109/ISEMC.1999.812930
Regular:

This paper presents results of investigations of the test setup for conducted emission measurements in the frequency rang from 150 kHz to 30 MHz according to CISPR 14:1993 and EN 55014:1993,... View More

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