IEEE - Institute of Electrical and Electronics Engineers, Inc. - Test facility uncertainty calculation methodology and rationale

Proceedings of 1999 International Symposium on Electromagnetic Compatibility (EMC'99)

Author(s): Heise, E.R. ; Heise, R.E.W.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Seattle, WA, USA, USA
Conference Date: 2 August 1999
Volume: 1
ISBN (Paper): 0-7803-5057-X
DOI: 10.1109/ISEMC.1999.812929
Regular:

A uniform technique to compute the measurement uncertainty of powerline and radiated emission (EMI) tests is presented. This method recommends frequency sampling, traceability to "true values",... View More

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