IEEE - Institute of Electrical and Electronics Engineers, Inc. - Microstrip coupling algorithm validation and modification based on measurements and numerical modeling

Proceedings of 1999 International Symposium on Electromagnetic Compatibility (EMC'99)

Author(s): Zeeff, T. ; Olsen, C.E. ; Hubing, T.H. ; Drewniak, J. ; DuBroff, D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Seattle, WA, USA, USA
Conference Date: 2 August 1999
Volume: 1
ISBN (Paper): 0-7803-5057-X
DOI: 10.1109/ISEMC.1999.812921
Regular:

In this study, mutual capacitance and inductance between two coupled traces is measured and computed to validate and simplify coupling algorithms used in an expert system software package. The... View More

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