IEEE - Institute of Electrical and Electronics Engineers, Inc. - The "current driven model"-experimental verification and the contribution of I/sub dd/ delta to digital device radiation

Proceedings of 1999 International Symposium on Electromagnetic Compatibility (EMC'99)

Author(s): Dash, G. ; Curtis, J. ; Straus, I.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Seattle, WA, USA, USA
Conference Date: 2 August 1999
Volume: 1
ISBN (Paper): 0-7803-5057-X
DOI: 10.1109/ISEMC.1999.812920
Regular:

Several researchers have proposed that a primary source of emissions from digital devices is due to the partial inductance of the return trace on printed circuit boards. In this "current driven... View More

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