IEEE - Institute of Electrical and Electronics Engineers, Inc. - Evaluation of anechoic chamber characteristics using optically driven equipment under test

Proceedings of 1999 International Symposium on Electromagnetic Compatibility (EMC'99)

Author(s): Aquino, J.C. ; Kawashima, T. ; Tokuda, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Seattle, WA, USA, USA
Conference Date: 2 August 1999
Volume: 1
ISBN (Paper): 0-7803-5057-X
DOI: 10.1109/ISEMC.1999.812900
Regular:

The characteristics of an anechoic chamber lined with a foamed ferrite that can be composed as fully and semi-anechoic is evaluated using optically driven equipment under test (EUT). Measurement... View More

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