IEEE - Institute of Electrical and Electronics Engineers, Inc. - Statistical conversion factor between measurements of EMI in different test facilities

Proceedings of 1999 International Symposium on Electromagnetic Compatibility (EMC'99)

Author(s): Kappel, U. ; Hirsch, H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Seattle, WA, USA, USA
Conference Date: 2 August 1999
Volume: 1
ISBN (Paper): 0-7803-5057-X
DOI: 10.1109/ISEMC.1999.812883
Regular:

Measuring electromagnetic disturbance field strength often refers to open area test site measurements. Due to the largeness of open area test sites and their requirements to the environment they... View More

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