IEEE - Institute of Electrical and Electronics Engineers, Inc. - Characterization of loaded TEM-waveguides using time-domain reflectometry

Proceedings of 1999 International Symposium on Electromagnetic Compatibility (EMC'99)

Author(s): Karst, J.P. ; Garbe, H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Seattle, WA, USA, USA
Conference Date: 2 August 1999
Volume: 1
ISBN (Paper): 0-7803-5057-X
DOI: 10.1109/ISEMC.1999.812881
Regular:

An approach is presented to characterize the load state of a TEM-waveguide using the local characteristic impedance Z/sub c/(z) derived from time-domain reflectometry (TDR) measurements. The field... View More

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