IEEE - Institute of Electrical and Electronics Engineers, Inc. - Effect of lead length on the response of ESD protection devices

Proceedings of 1999 International Symposium on Electromagnetic Compatibility (EMC'99)

Author(s): Fallah, A.M. ; Nelson, R.M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Seattle, WA, USA, USA
Conference Date: 2 August 1999
Volume: 2
ISBN (Paper): 0-7803-5057-X
DOI: 10.1109/ISEMC.1999.810202
Regular:

One method of protecting electronic components from the effects of ESD is to shunt the ESD current to ground. The response of the protection devices can be affected, however, by parasitic... View More

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