IEEE - Institute of Electrical and Electronics Engineers, Inc. - Comparing different measurement approaches in a mode-stirred chamber

Proceedings of 1999 International Symposium on Electromagnetic Compatibility (EMC'99)

Author(s): Petirsch, M. ; Kurner, W. ; Sotriffer, I. ; Schwab, A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Seattle, WA, USA, USA
Conference Date: 2 August 1999
Volume: 2
ISBN (Paper): 0-7803-5057-X
DOI: 10.1109/ISEMC.1999.810182
Regular:

This paper presents the use of a mode-stirred chamber (MSC) for electromagnetic susceptibility (EMS) measurement. The distribution of the field inside the chamber is shown as well as the... View More

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